Optical and X-ray clusters as tracers of the supercluster-void network

M. Einasto et al. 2000

We study the properties of the supercluster-void network as traced by different optical and X-ray clusters: Abell and APM clusters, and X-ray clusters, and present supercluster catalogues and correlation functions for these datasets.  We show that the characteristic scale of this network is 120 Mpc -  a distance between superclusters at opposite void walls.

We also compare the space distribution of Abell clusters of different richness classes and show that we can use Abell clusters of richness R = 0 for the purposes of our study.

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